ENTRY 23612 20240209 23212361200000001 SUBENT 23612001 20240209 23212361200100001 BIB 17 86 2361200100002 TITLE Development of neutron interferometer using 2361200100003 multilayer mirrors and measurements of 2361200100004 neutron-nuclear scattering length with pulsed neutron 2361200100005 source 2361200100006 AUTHOR (T.Fujiie,M.Hino,T.Hosobata,G.Ichikawa, M.Kitaguchi, 2361200100007 Y.Seki,H.M.Shimizu,Y.Yamagata) 2361200100008 INSTITUTE (2JPNNAG,2JPNIPC,2JPNKTO,2JPNKEK,2JPNTOH) 2361200100009 (2JPNJPN) J-PARC Center, Tokai, Ibaraki 319-1195, Japan2361200100010 REFERENCE (J,PRL,132,023402,2024) 2361200100011 #doi:10.1103/PhysRevLett.132.023402 2361200100012 FACILITY (SYNCH,2JPNKEK) BL05 Low-Divergence beam branch in 2361200100013 MLF at J-PARC 2361200100014 INC-SOURCE (SPALL) The pulsed neutron beams are produced by the 2361200100015 spallation process at the MLF in J-PARC. 2361200100016 Pulsed neutrons were moderated by a liquid hydrogen 2361200100017 moderator and directed to the experimental setup via 2361200100018 a neutron mirror bender, a four-blade slit, and a 2361200100019 vacuum guide tube. 2361200100020 The proton beam power was approximately 620 kW. 2361200100021 DETECTOR Interferometer: 2361200100022 (SCIN) 2361200100023 Interferometer with two beam-splitting etalons (BSEs) 2361200100024 was used in the experiment. 2361200100025 The BSEs were designed with half and total reflection 2361200100026 mirrors. The first BSE splits neutron waves into two 2361200100027 parallel paths and the second one recombines them. 2361200100028 Samples were inserted one of the parallel paths. 2361200100029 The interference pattern of the neutron waves was 2361200100030 detected by a neutron detector equipped with a thin 2361200100031 ZnS/6LiF scintillator. 2361200100032 SAMPLE Two 0.3-mm-thick V metal plates (purity: 99%) and 2361200100033 a 0.3-mm-thick V-Ni alloy plate (V:Ni = 94.58:5.32) 2361200100034 were used as samples. 2361200100035 Elemental analyses on the samples were performed with 2361200100036 XRF and gas chromatography, and no significant 2361200100037 impurities were identified. 2361200100038 A 0.3-mm-thick N-type Si wafer was used for 2361200100039 normalization. 2361200100040 METHOD (TOF) 2361200100041 The interference pattern of the neutron waves from 2361200100042 the interferometer was detected by the neutron 2361200100043 detector installed at flight length of 17.74 m. 2361200100044 ANALYSIS The neutron-nuclear scattering length of V was 2361200100045 derived using the phase shift between the interference 2361200100046 patterns with and without samples. 2361200100047 CORRECTION To eliminate uncertainty arising from the neutron 2361200100048 wavelength of the pulse source, the scattering length 2361200100049 was determined relative to Si. 2361200100050 The effects of impurities were eliminated. 2361200100051 The effect of reducing the atmospheric path by the 2361200100052 thickness of the sample was corrected. 2361200100053 MONITOR (14-SI-0(N,THS)14-SI-0,BA/COH,AMP) 2361200100054 MONIT-REF ((MONIT),,J,NNEWS,3,26,1992) 2361200100055 ASSUMED The following scattering length were assumed to 2361200100056 deduce the effects of the impurities and the 2361200100057 atmospheric phase shift. 2361200100058 The values were taken from MONIT-REF. 2361200100059 (ASSUM1,28-NI-0(N,THS)28-NI-0,BA/COH,AMP) 2361200100060 (ASSUM2,1-H-0(N,THS)1-H-0,BA/COH,AMP) 2361200100061 (ASSUM3,7-N-0(N,THS)7-N-0,BA/COH,AMP) 2361200100062 (ASSUM4,8-O-0(N,THS)8-O-0,BA/COH,AMP) 2361200100063 (ASSUM5,13-AL-27(N,THS)13-AL-27,BA/COH,AMP) 2361200100064 ERR-ANALYS (MONIT-ERR) Uncertainty of the Si scattering length. 2361200100065 (ASSUM1-ERR) Uncertainty of the Ni scattering length. 2361200100066 (ASSUM2-ERR) Uncertainty of the H scattering length. 2361200100067 (ASSUM3-ERR) Uncertainty of the N scattering length. 2361200100068 (ASSUM4-ERR) Uncertainty of the O scattering length. 2361200100069 (ASSUM5-ERR) Uncertainty of the Al scattering length. 2361200100070 (DATA-ERR) No information on partial uncertainties for 2361200100071 the final scattering length of V. 2361200100072 The following uncertainties were considered and 2361200100073 those for each sample (before the normalization and 2361200100074 the impurity correction) were provided in the 2361200100075 Table 1 of the Supplemental Material. 2361200100076 Si sample V samples V-Ni 2361200100077 Statistics 0.0092% 0.039% 0.061% 0.31 % 2361200100078 Sample thickness 0.38 % 0.41 % 0.47 % 1.7 % 2361200100079 Sample rotation 0.053 % 0.039% 0.039% 0.039% 2361200100080 Flight length 0.54 % 0.53 % 0.53 % 0.49 % 2361200100081 Impurity ratio 0.082 % 0.081% 0.081% 0.078% 2361200100082 Air scattering 0.0049% 0.027% 0.027% 0.22 % 2361200100083 ADD-RES Bound atom coherent scattering amplitudes of Si, Ti 2361200100084 and Al, which were not compiled since 2361200100085 - not normalised 2361200100086 - not corrected for impurities 2361200100087 HISTORY (20240209C) Compiled by A.Kimura. 2361200100088 ENDBIB 86 0 2361200100089 COMMON 12 6 2361200100090 MONIT MONIT-ERR ASSUM1 ASSUM1-ERR ASSUM2 ASSUM2-ERR 2361200100091 ASSUM3 ASSUM3-ERR ASSUM4 ASSUM4-ERR ASSUM5 ASSUM5-ERR 2361200100092 FERMI FERMI FERMI FERMI FERMI FERMI 2361200100093 FERMI FERMI FERMI FERMI FERMI FERMI 2361200100094 4.1491 0.0010 10.3 0.1 -3.7390 0.00112361200100095 9.36 0.02 5.803 0.004 3.449 0.0052361200100096 ENDCOMMON 6 0 2361200100097 ENDSUBENT 96 0 2361200199999 SUBENT 23612002 20240209 23212361200200001 BIB 3 6 2361200200002 REACTION (23-V-0(N,THS)23-V-0,BA/COH,AMP) 2361200200003 SAMPLE Two 0.3-mm-thick V metal plates (purity: 99%). 2361200200004 The results of the two samples were averaged 2361200200005 to derive the scattering lengths of V. 2361200200006 STATUS (TABLE,,T.Fujiie+,J,PRL,132,023402,2024) text in p.4 2361200200007 (COREL,23612003) Measurement with V-Ni alloy plate 2361200200008 ENDBIB 6 0 2361200200009 NOCOMMON 0 0 2361200200010 DATA 3 1 2361200200011 EN DATA DATA-ERR 2361200200012 EV FERMI FERMI 2361200200013 0. -0.555 0.003 2361200200014 ENDDATA 3 0 2361200200015 ENDSUBENT 14 0 2361200299999 SUBENT 23612003 20240209 23212361200300001 BIB 3 4 2361200300002 REACTION (23-V-0(N,THS)23-V-0,BA/COH,AMP) 2361200300003 SAMPLE A 0.3-mm-thick V-Ni alloy plate (V:Ni = 94.58:5.32) 2361200300004 STATUS (TABLE,,T.Fujiie+,J,PRL,132,023402,2024) text in p.4 2361200300005 (COREL,23612002) Measurement with V metal plates 2361200300006 ENDBIB 4 0 2361200300007 NOCOMMON 0 0 2361200300008 DATA 3 1 2361200300009 EN DATA DATA-ERR 2361200300010 EV FERMI FERMI 2361200300011 0. -0.559 0.005 2361200300012 ENDDATA 3 0 2361200300013 ENDSUBENT 12 0 2361200399999 ENDENTRY 3 0 2361299999999