ENTRY C0193 20240303 C235C019300000001 SUBENT C0193001 20240303 C235C019300100001 BIB 9 14 C019300100002 INSTITUTE (1CANCRC) C019300100003 REFERENCE (J,NIM,168,611,1980) C019300100004 #doi:10.1016/0029-554X(80)91319-1 C019300100005 AUTHOR (J.A.Davies,P.R.Norton) C019300100006 TITLE Absolute coverage measurement of absorbed CO and D2 on C019300100007 platinum C019300100008 FACILITY (VDG,1CANCRC) 2.5 MV Van de Graaff accelerator C019300100009 METHOD Frozen gas technique C019300100010 DETECTOR (SIBAR) Two bakeable solid state (Ortec) detectors are C019300100011 mounted above and below the target on linear motion C019300100012 drives C019300100013 STATUS (TABLE,,J.A.Davies+,J,NIM,168,611,1980) Table 2 C019300100014 HISTORY (19981102C) C019300100015 (20240218A) OS. BIB updates C019300100016 ENDBIB 14 0 C019300100017 COMMON 1 3 C019300100018 ANG C019300100019 ADEG C019300100020 150. C019300100021 ENDCOMMON 3 0 C019300100022 ENDSUBENT 21 0 C019300199999 SUBENT C0193002 19981102 0000C019300200001 BIB 4 9 C019300200002 REACTION (8-O-16(D,P)8-O-17,PAR,DA) C019300200003 SAMPLE Ta2O5 sample and silicon wafer implanted with bismuth. C019300200004 MONITOR (83-BI-209(A,EL)83-BI-209,,DA) C019300200005 From ratio of 16O(d,p)/209Bi(a,el) = 760+-15. C019300200006 ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in: C019300200007 . absolute values of Bi standard, C019300200008 . thickness correction to (d,p) cross section, C019300200009 . counting statistics in yield ratio measurements, C019300200010 . geometry reporducibility in comparing to standard. C019300200011 ENDBIB 9 0 C019300200012 COMMON 1 3 C019300200013 EN C019300200014 MEV C019300200015 970. C019300200016 ENDCOMMON 3 0 C019300200017 DATA 5 1 C019300200018 E-LVL DATA DATA-ERR EN-NRM MONIT C019300200019 MEV MB/SR MB/SR MEV MB/SR C019300200020 0.87 13.3 0.4 2.0 1.007 +04 C019300200021 ENDDATA 3 0 C019300200022 ENDSUBENT 21 0 C019300299999 SUBENT C0193003 19981102 0000C019300300001 BIB 4 11 C019300300002 REACTION (6-C-12(D,P)6-C-13,,DA) C019300300003 SAMPLE CO2 frozen gas sample. C019300300004 MONITOR (8-O-16(D,P)8-O-17,PAR,DA) C019300300005 ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in: C019300300006 . absolute values of 2 primary standards (Bi, O) C019300300007 (1.5%), C019300300008 . thickness correction to (d,p) cross section (2%), C019300300009 . counting statistics in yield ratio measurements C019300300010 (<1%), C019300300011 . geometry reporducibility in comparing standards C019300300012 (<1%). C019300300013 ENDBIB 11 0 C019300300014 NOCOMMON 0 0 C019300300015 DATA 3 1 C019300300016 EN DATA DATA-ERR C019300300017 KEV MB/SR MB/SR C019300300018 970. 25.5 0.8 C019300300019 ENDDATA 3 0 C019300300020 ENDSUBENT 19 0 C019300399999 SUBENT C0193004 19981102 0000C019300400001 BIB 4 11 C019300400002 REACTION (1-H-2(HE3,P)2-HE-4,,DA) C019300400003 SAMPLE D2O frozen gas sample. C019300400004 MONITOR (8-O-16(D,P)8-O-17,PAR,DA) C019300400005 ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in: C019300400006 . absolute values of 2 primary standards (Bi, O) C019300400007 (1.5%), C019300400008 . thickness correction to (d,p) cross section (2%), C019300400009 . counting statistics in yield ratio measurements C019300400010 (<1%), C019300400011 . geometry reporducibility in comparing standards C019300400012 (<1%). C019300400013 ENDBIB 11 0 C019300400014 NOCOMMON 0 0 C019300400015 DATA 3 1 C019300400016 EN DATA DATA-ERR C019300400017 KEV MB/SR MB/SR C019300400018 750. 54.5 1.7 C019300400019 ENDDATA 3 0 C019300400020 ENDSUBENT 19 0 C019300499999 ENDENTRY 4 0 C019399999999