ENTRY C0193 20240303 C235C019300000001
SUBENT C0193001 20240303 C235C019300100001
BIB 9 14 C019300100002
INSTITUTE (1CANCRC) C019300100003
REFERENCE (J,NIM,168,611,1980) C019300100004
#doi:10.1016/0029-554X(80)91319-1 C019300100005
AUTHOR (J.A.Davies,P.R.Norton) C019300100006
TITLE Absolute coverage measurement of absorbed CO and D2 on C019300100007
platinum C019300100008
FACILITY (VDG,1CANCRC) 2.5 MV Van de Graaff accelerator C019300100009
METHOD Frozen gas technique C019300100010
DETECTOR (SIBAR) Two bakeable solid state (Ortec) detectors are C019300100011
mounted above and below the target on linear motion C019300100012
drives C019300100013
STATUS (TABLE,,J.A.Davies+,J,NIM,168,611,1980) Table 2 C019300100014
HISTORY (19981102C) C019300100015
(20240218A) OS. BIB updates C019300100016
ENDBIB 14 0 C019300100017
COMMON 1 3 C019300100018
ANG C019300100019
ADEG C019300100020
150. C019300100021
ENDCOMMON 3 0 C019300100022
ENDSUBENT 21 0 C019300199999
SUBENT C0193002 19981102 0000C019300200001
BIB 4 9 C019300200002
REACTION (8-O-16(D,P)8-O-17,PAR,DA) C019300200003
SAMPLE Ta2O5 sample and silicon wafer implanted with bismuth. C019300200004
MONITOR (83-BI-209(A,EL)83-BI-209,,DA) C019300200005
From ratio of 16O(d,p)/209Bi(a,el) = 760+-15. C019300200006
ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in: C019300200007
. absolute values of Bi standard, C019300200008
. thickness correction to (d,p) cross section, C019300200009
. counting statistics in yield ratio measurements, C019300200010
. geometry reporducibility in comparing to standard. C019300200011
ENDBIB 9 0 C019300200012
COMMON 1 3 C019300200013
EN C019300200014
MEV C019300200015
970. C019300200016
ENDCOMMON 3 0 C019300200017
DATA 5 1 C019300200018
E-LVL DATA DATA-ERR EN-NRM MONIT C019300200019
MEV MB/SR MB/SR MEV MB/SR C019300200020
0.87 13.3 0.4 2.0 1.007 +04 C019300200021
ENDDATA 3 0 C019300200022
ENDSUBENT 21 0 C019300299999
SUBENT C0193003 19981102 0000C019300300001
BIB 4 11 C019300300002
REACTION (6-C-12(D,P)6-C-13,,DA) C019300300003
SAMPLE CO2 frozen gas sample. C019300300004
MONITOR (8-O-16(D,P)8-O-17,PAR,DA) C019300300005
ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in: C019300300006
. absolute values of 2 primary standards (Bi, O) C019300300007
(1.5%), C019300300008
. thickness correction to (d,p) cross section (2%), C019300300009
. counting statistics in yield ratio measurements C019300300010
(<1%), C019300300011
. geometry reporducibility in comparing standards C019300300012
(<1%). C019300300013
ENDBIB 11 0 C019300300014
NOCOMMON 0 0 C019300300015
DATA 3 1 C019300300016
EN DATA DATA-ERR C019300300017
KEV MB/SR MB/SR C019300300018
970. 25.5 0.8 C019300300019
ENDDATA 3 0 C019300300020
ENDSUBENT 19 0 C019300399999
SUBENT C0193004 19981102 0000C019300400001
BIB 4 11 C019300400002
REACTION (1-H-2(HE3,P)2-HE-4,,DA) C019300400003
SAMPLE D2O frozen gas sample. C019300400004
MONITOR (8-O-16(D,P)8-O-17,PAR,DA) C019300400005
ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in: C019300400006
. absolute values of 2 primary standards (Bi, O) C019300400007
(1.5%), C019300400008
. thickness correction to (d,p) cross section (2%), C019300400009
. counting statistics in yield ratio measurements C019300400010
(<1%), C019300400011
. geometry reporducibility in comparing standards C019300400012
(<1%). C019300400013
ENDBIB 11 0 C019300400014
NOCOMMON 0 0 C019300400015
DATA 3 1 C019300400016
EN DATA DATA-ERR C019300400017
KEV MB/SR MB/SR C019300400018
750. 54.5 1.7 C019300400019
ENDDATA 3 0 C019300400020
ENDSUBENT 19 0 C019300499999
ENDENTRY 4 0 C019399999999