ENTRY D4428 20240130 D142D442800000001
SUBENT D4428001 20240130 D142D442800100001
BIB 10 37 D442800100002
TITLE Precise resonance parameter measurement in the D442800100003
12C(p,a)13N astrophysically important reaction D442800100004
AUTHOR (L.Csedreki,Gy.Gyurky,T.Szucs) D442800100005
INSTITUTE (3HUNDEB) D442800100006
REFERENCE (J,NP/A,1037,122705,2023) D442800100007
#doi:10.1016/j.nuclphysa.2023.122705 D442800100008
FACILITY (VDGT,3HUNDEB) D442800100009
SAMPLE Solid state targets were prepared using electron beam D442800100010
evaporation of natural carbon onto 0.5 mm thick D442800100011
tantalum backings. Two carbon targets were used with D442800100012
thicknesses of 1.8+-0.1 and 2.4+-0.1 keV at Ep=1747 keVD442800100013
determined by the yield curve analysis of the D442800100014
Ep=1747 keV resonance of 13C(p,g)14N, correspond to a D442800100015
surface density of carbon atoms of D442800100016
(5.7+-0.3)*10e17 and (7.7+-0.4)*10e17 atom/cm2, D442800100017
respectively. D442800100018
DETECTOR (HPGE) D442800100019
METHOD Targets were irradiated in a Faraday-type target D442800100020
chamber with proton beam of 0.5 - 4.0 uA. Three HPGE D442800100021
detector were placed around the targetat 0, 90 and 112 D442800100022
degrees. Angular distribution was studied using two D442800100023
detectors at at 55 and 90 degree positions. D442800100024
Dead time was kept below 2%. D442800100025
Reaction yield curves in the vicinity of the Ep=460 andD442800100026
1700 keV resonances were measured with energy steps of D442800100027
2-50 keV. D442800100028
The experimental yields measured at E projectile energyD442800100029
were fitted with a single Breit-Wigner formula. D442800100030
A simplified R-matrix analysis was also performed to D442800100031
extract resonance energies and widths. D442800100032
The energy of the primary beam vas determined to a D442800100033
precision of better than 1 keV. D442800100034
ERR-ANALYS (ERR-1) stopping power (5%) D442800100035
(ERR-2) target thickness (5%) D442800100036
(ERR-3) peak area (5%) D442800100037
(ERR-4) detector efficiency (12%) D442800100038
HISTORY (20240130C) st D442800100039
ENDBIB 37 0 D442800100040
COMMON 4 3 D442800100041
ERR-1 ERR-2 ERR-3 ERR-4 D442800100042
PER-CENT PER-CENT PER-CENT PER-CENT D442800100043
5. 5. 5. 12. D442800100044
ENDCOMMON 3 0 D442800100045
ENDSUBENT 44 0 D442800199999
SUBENT D4428002 20240130 D142D442800200001
BIB 4 6 D442800200002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800200003
Thin target gamma yield at the given angle in counts, D442800200004
data were normalized to 1 micro-Coulomb charge. D442800200005
SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800200006
ERR-ANALYS (ERR-S) statistical uncertainty D442800200007
STATUS (TABLE) Numerical data were provided by author. D442800200008
ENDBIB 6 0 D442800200009
COMMON 2 3 D442800200010
ANG EN-ERR D442800200011
ADEG KEV D442800200012
0.0 0.3 D442800200013
ENDCOMMON 3 0 D442800200014
DATA 3 24 D442800200015
EN DATA ERR-S D442800200016
KEV ARB-UNITS ARB-UNITS D442800200017
349.0 0.032 0.006 D442800200018
398.9 0.139 0.008 D442800200019
422.5 0.393 0.020 D442800200020
432.3 0.628 0.029 D442800200021
442.1 1.137 0.049 D442800200022
446.1 1.488 0.069 D442800200023
450.0 1.741 0.084 D442800200024
452.0 1.948 0.084 D442800200025
453.9 2.199 0.098 D442800200026
455.9 2.171 0.100 D442800200027
457.8 2.245 0.104 D442800200028
459.8 2.388 0.108 D442800200029
461.8 2.327 0.095 D442800200030
463.7 2.284 0.101 D442800200031
465.7 2.220 0.097 D442800200032
467.7 2.002 0.090 D442800200033
469.6 1.912 0.088 D442800200034
471.6 1.748 0.072 D442800200035
475.5 1.475 0.070 D442800200036
477.5 1.392 0.057 D442800200037
481.4 1.036 0.051 D442800200038
491.2 0.668 0.034 D442800200039
501.1 0.477 0.025 D442800200040
520.7 0.255 0.015 D442800200041
ENDDATA 26 0 D442800200042
ENDSUBENT 41 0 D442800299999
SUBENT D4428003 20240130 D142D442800300001
BIB 4 6 D442800300002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800300003
Thin target gamma yield at the given angle in counts, D442800300004
data were normalized to 1 micro-Coulomb charge. D442800300005
SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800300006
ERR-ANALYS (ERR-S) statistical uncertainty D442800300007
STATUS (TABLE) Numerical data were provided by author. D442800300008
ENDBIB 6 0 D442800300009
COMMON 2 3 D442800300010
ANG EN-ERR D442800300011
ADEG KEV D442800300012
90.0 0.3 D442800300013
ENDCOMMON 3 0 D442800300014
DATA 3 24 D442800300015
EN DATA ERR-S D442800300016
KEV ARB-UNITS ARB-UNITS D442800300017
349.0 0.008 0.005 D442800300018
398.9 0.049 0.004 D442800300019
422.5 0.133 0.011 D442800300020
432.3 0.232 0.015 D442800300021
442.1 0.420 0.025 D442800300022
446.1 0.541 0.036 D442800300023
450.0 0.594 0.043 D442800300024
452.0 0.662 0.040 D442800300025
453.9 0.682 0.043 D442800300026
455.9 0.873 0.054 D442800300027
457.8 0.823 0.053 D442800300028
459.8 0.757 0.049 D442800300029
461.8 0.785 0.043 D442800300030
463.7 0.824 0.051 D442800300031
465.7 0.762 0.045 D442800300032
467.7 0.694 0.045 D442800300033
469.6 0.649 0.043 D442800300034
471.6 0.603 0.034 D442800300035
475.5 0.555 0.036 D442800300036
477.5 0.446 0.026 D442800300037
481.4 0.335 0.025 D442800300038
491.2 0.237 0.018 D442800300039
501.1 0.176 0.014 D442800300040
520.7 0.089 0.008 D442800300041
ENDDATA 26 0 D442800300042
ENDSUBENT 41 0 D442800399999
SUBENT D4428004 20240130 D142D442800400001
BIB 4 6 D442800400002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800400003
Thin target gamma yield at the given angle in counts, D442800400004
data were normalized to 1 micro-Coulomb charge. D442800400005
SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800400006
ERR-ANALYS (ERR-S) statistical uncertainty D442800400007
STATUS (TABLE) Numerical data were provided by author. D442800400008
ENDBIB 6 0 D442800400009
COMMON 2 3 D442800400010
ANG EN-ERR D442800400011
ADEG KEV D442800400012
121.0 0.3 D442800400013
ENDCOMMON 3 0 D442800400014
DATA 3 24 D442800400015
EN DATA ERR-S D442800400016
KEV ARB-UNITS ARB-UNITS D442800400017
349.0 0.012 0.006 D442800400018
398.9 0.068 0.005 D442800400019
422.5 0.190 0.013 D442800400020
432.3 0.319 0.019 D442800400021
442.1 0.544 0.029 D442800400022
446.1 0.636 0.039 D442800400023
450.0 0.868 0.054 D442800400024
452.0 0.876 0.049 D442800400025
453.9 0.899 0.052 D442800400026
455.9 1.089 0.063 D442800400027
457.8 1.150 0.064 D442800400028
459.8 1.158 0.065 D442800400029
461.8 1.159 0.056 D442800400030
463.7 1.101 0.061 D442800400031
465.7 1.066 0.058 D442800400032
467.7 0.985 0.055 D442800400033
469.6 0.852 0.051 D442800400034
471.6 0.802 0.041 D442800400035
475.5 0.689 0.041 D442800400036
477.5 0.669 0.033 D442800400037
481.4 0.535 0.033 D442800400038
491.2 0.330 0.021 D442800400039
501.1 0.225 0.016 D442800400040
520.7 0.142 0.010 D442800400041
ENDDATA 26 0 D442800400042
ENDSUBENT 41 0 D442800499999
SUBENT D4428005 20240130 D142D442800500001
BIB 4 6 D442800500002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800500003
Thin target gamma yield at the given angle in counts, D442800500004
data were normalized to 1 micro-Coulomb charge. D442800500005
SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800500006
ERR-ANALYS (ERR-S) statistical uncertainty D442800500007
STATUS (TABLE) Numerical data were provided by author. D442800500008
ENDBIB 6 0 D442800500009
COMMON 2 3 D442800500010
ANG EN-ERR D442800500011
ADEG KEV D442800500012
0.0 0.4 D442800500013
ENDCOMMON 3 0 D442800500014
DATA 3 33 D442800500015
EN DATA ERR-S D442800500016
KEV ARB-UNITS ARB-UNITS D442800500017
1561.9 0.037 0.003 D442800500018
1581.5 0.045 0.005 D442800500019
1601.2 0.054 0.006 D442800500020
1611.0 0.070 0.006 D442800500021
1620.8 0.085 0.007 D442800500022
1630.6 0.097 0.007 D442800500023
1640.4 0.124 0.009 D442800500024
1648.3 0.139 0.009 D442800500025
1654.2 0.186 0.010 D442800500026
1660.1 0.198 0.013 D442800500027
1666.0 0.224 0.013 D442800500028
1669.9 0.250 0.015 D442800500029
1675.8 0.283 0.015 D442800500030
1679.7 0.304 0.016 D442800500031
1683.7 0.309 0.014 D442800500032
1687.6 0.299 0.018 D442800500033
1690.5 0.324 0.016 D442800500034
1693.5 0.253 0.017 D442800500035
1695.4 0.272 0.017 D442800500036
1699.4 0.215 0.013 D442800500037
1699.4 0.230 0.014 D442800500038
1703.3 0.204 0.012 D442800500039
1706.2 0.171 0.011 D442800500040
1709.2 0.186 0.011 D442800500041
1713.1 0.135 0.010 D442800500042
1719.0 0.132 0.008 D442800500043
1728.8 0.057 0.006 D442800500044
1739.6 0.053 0.005 D442800500045
1742.6 0.053 0.006 D442800500046
1746.5 0.030 0.006 D442800500047
1752.4 0.032 0.006 D442800500048
1762.2 0.010 0.005 D442800500049
1778.0 0.003 0.004 D442800500050
ENDDATA 35 0 D442800500051
ENDSUBENT 50 0 D442800599999
SUBENT D4428006 20240130 D142D442800600001
BIB 4 6 D442800600002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800600003
Thin target gamma yield at the given angle in counts, D442800600004
data were normalized to 1 micro-Coulomb charge. D442800600005
SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800600006
ERR-ANALYS (ERR-S) statistical uncertainty D442800600007
STATUS (TABLE) Numerical data were provided by author. D442800600008
ENDBIB 6 0 D442800600009
COMMON 2 3 D442800600010
ANG EN-ERR D442800600011
ADEG KEV D442800600012
90.0 0.4 D442800600013
ENDCOMMON 3 0 D442800600014
DATA 3 33 D442800600015
EN DATA ERR-S D442800600016
KEV ARB-UNITS ARB-UNITS D442800600017
1561.9 0.021 0.002 D442800600018
1581.5 0.024 0.003 D442800600019
1601.2 0.039 0.003 D442800600020
1611.0 0.037 0.003 D442800600021
1620.8 0.057 0.004 D442800600022
1630.6 0.079 0.004 D442800600023
1640.4 0.090 0.005 D442800600024
1648.3 0.126 0.007 D442800600025
1654.2 0.155 0.007 D442800600026
1660.1 0.175 0.010 D442800600027
1666.0 0.237 0.011 D442800600028
1669.9 0.259 0.012 D442800600029
1675.8 0.296 0.013 D442800600030
1679.7 0.304 0.013 D442800600031
1683.7 0.342 0.014 D442800600032
1687.6 0.365 0.017 D442800600033
1690.5 0.332 0.014 D442800600034
1693.5 0.324 0.015 D442800600035
1695.4 0.337 0.016 D442800600036
1699.4 0.299 0.012 D442800600037
1699.4 0.331 0.014 D442800600038
1703.3 0.296 0.012 D442800600039
1709.2 0.241 0.011 D442800600040
1713.1 0.198 0.009 D442800600041
1719.0 0.176 0.008 D442800600042
1728.8 0.124 0.006 D442800600043
1739.6 0.086 0.007 D442800600044
1739.6 0.088 0.004 D442800600045
1742.6 0.084 0.005 D442800600046
1746.5 0.077 0.005 D442800600047
1752.4 0.060 0.004 D442800600048
1762.2 0.051 0.003 D442800600049
1778.0 0.036 0.002 D442800600050
ENDDATA 35 0 D442800600051
ENDSUBENT 50 0 D442800699999
SUBENT D4428007 20240130 D142D442800700001
BIB 4 6 D442800700002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800700003
Thin target gamma yield at the given angle in counts, D442800700004
data were normalized to 1 micro-Coulomb charge. D442800700005
SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800700006
ERR-ANALYS (ERR-S) statistical uncertainty D442800700007
STATUS (TABLE) Numerical data were provided by author. D442800700008
ENDBIB 6 0 D442800700009
COMMON 2 3 D442800700010
ANG EN-ERR D442800700011
ADEG KEV D442800700012
121.0 0.4 D442800700013
ENDCOMMON 3 0 D442800700014
DATA 3 34 D442800700015
EN DATA ERR-S D442800700016
KEV ARB-UNITS ARB-UNITS D442800700017
1561.9 0.022 0.002 D442800700018
1581.5 0.026 0.003 D442800700019
1601.2 0.038 0.003 D442800700020
1611.0 0.043 0.003 D442800700021
1620.8 0.057 0.004 D442800700022
1630.6 0.067 0.004 D442800700023
1640.4 0.086 0.005 D442800700024
1648.3 0.118 0.006 D442800700025
1654.2 0.141 0.007 D442800700026
1660.1 0.170 0.010 D442800700027
1666.0 0.210 0.010 D442800700028
1669.9 0.245 0.012 D442800700029
1675.8 0.289 0.013 D442800700030
1679.7 0.324 0.014 D442800700031
1683.7 0.339 0.014 D442800700032
1687.6 0.346 0.017 D442800700033
1690.5 0.319 0.014 D442800700034
1693.5 0.343 0.016 D442800700035
1695.4 0.344 0.017 D442800700036
1699.4 0.297 0.013 D442800700037
1699.4 0.303 0.013 D442800700038
1703.3 0.284 0.012 D442800700039
1706.2 0.249 0.011 D442800700040
1709.2 0.249 0.011 D442800700041
1713.1 0.197 0.010 D442800700042
1719.0 0.180 0.008 D442800700043
1728.8 0.115 0.006 D442800700044
1739.6 0.082 0.008 D442800700045
1739.6 0.098 0.005 D442800700046
1742.6 0.080 0.005 D442800700047
1746.5 0.071 0.005 D442800700048
1752.4 0.062 0.004 D442800700049
1762.2 0.048 0.004 D442800700050
1778.0 0.038 0.002 D442800700051
ENDDATA 36 0 D442800700052
ENDSUBENT 51 0 D442800799999
SUBENT D4428008 20240130 D142D442800800001
BIB 4 6 D442800800002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800800003
Thin target gamma yield at the given angles in counts, D442800800004
data were normalized to 1 micro-Coulomb charge. D442800800005
SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800800006
ERR-ANALYS (ERR-S) statistical uncertainty D442800800007
STATUS (TABLE) Numerical data were provided by author. D442800800008
ENDBIB 6 0 D442800800009
COMMON 1 3 D442800800010
EN D442800800011
KEV D442800800012
460. D442800800013
ENDCOMMON 3 0 D442800800014
DATA 4 4 D442800800015
ANG-CM ANG-RSL-FW DATA ERR-S D442800800016
ADEG ADEG ARB-UNITS ARB-UNITS D442800800017
0. 27. 459.35 20.70 D442800800018
58.9 16.7 486.72 48.67 D442800800019
94.5 16.7 463.87 18.14 D442800800020
116.2 25. 482.03 40.18 D442800800021
ENDDATA 6 0 D442800800022
ENDSUBENT 21 0 D442800899999
SUBENT D4428009 20240130 D142D442800900001
BIB 4 6 D442800900002
REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800900003
Thin target gamma yield at the given angles in counts, D442800900004
data were normalized to 1 micro-Coulomb charge. D442800900005
SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800900006
ERR-ANALYS (ERR-S) statistical uncertainty D442800900007
STATUS (TABLE) Numerical data were provided by author. D442800900008
ENDBIB 6 0 D442800900009
COMMON 1 3 D442800900010
EN D442800900011
KEV D442800900012
1717. D442800900013
ENDCOMMON 3 0 D442800900014
DATA 4 4 D442800900015
ANG-CM ANG-RSL-FW DATA ERR-S D442800900016
ADEG ADEG ARB-UNITS ARB-UNITS D442800900017
0. 27. 459.35 20.70 D442800900018
58.9 16.7 486.72 48.67 D442800900019
94.5 16.7 463.87 18.14 D442800900020
116.2 25. 482.03 40.18 D442800900021
ENDDATA 6 0 D442800900022
ENDSUBENT 21 0 D442800999999
SUBENT D4428010 20240130 D142D442801000001
BIB 4 6 D442801000002
REACTION (6-C-12(P,TOT),,WID) D442801000003
SAMPLE Target thickness: D442801000004
. 4.3 and 5.7 keV at Ep=460 keV D442801000005
. 1.8 and 2.4 keV at Ep=1700 keV D442801000006
ERR-ANALYS (DATA-ERR) No information on source of uncertainty D442801000007
STATUS (TABLE,,L.Csedreki,J,NP/A,1037,122705,2023) Text (p.8) D442801000008
ENDBIB 6 0 D442801000009
NOCOMMON 0 0 D442801000010
DATA 4 2 D442801000011
EN-RES EN-RES-ERR DATA DATA-ERR D442801000012
KEV KEV KEV KEV D442801000013
459.8 0.8 38.2 0.5 D442801000014
1685.1 0.7 57.6 0.8 D442801000015
ENDDATA 4 0 D442801000016
ENDSUBENT 15 0 D442801099999
ENDENTRY 10 0 D442899999999